VLSI TEST PRINCIPLES AND ARCHITECTURES (Record no. 17677)

MARC details
000 -LEADER
fixed length control field 00398nam a2200169Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 181012s9999 xx 000 0 und d
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9789380501550
082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER
Classification number 621.395 WAN
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name WANG LAUNG-TERNG
245 #0 - TITLE STATEMENT
Title VLSI TEST PRINCIPLES AND ARCHITECTURES
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. MORGAN KAUFMAN
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Date of publication, distribution, etc. 2013
300 ## - PHYSICAL DESCRIPTION
Extent 777 P
365 ## - TRADE PRICE
Price amount 625.00
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element ELECTRONICS
942 ## - ADDED ENTRY ELEMENTS (KOHA)
Koha item type Books
Holdings
Withdrawn status Lost status Damaged status Not for loan Bill No Bill Date Home library Current library Source of acquisition Cost, normal purchase price Total Checkouts Total Renewals Full call number Barcode Date last seen Date last checked out Cost, replacement price Price effective from Koha item type Public note
        16261 16/02/2013 VIT Central Library VIT Central Library MENTA 625.00 8 5 621.395 WAN 36367 17/05/2024 08/05/2024 625.00 12/10/2018 Books ELECTRONICS