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RELIABILITY WEAROUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES
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TextPublication details: JOHN WILEY; 2009Description: 624 PISBN: - 9780471731726
- 621.381 STR
| Item type | Current library | Call number | Status | Notes | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
| Reference | VIT Central Library | 621.381 STR (Browse shelf(Opens below)) | Not for loan | ELECTRONICS | 30035 |
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| 621.381 SOU DIGITAL ELECTRONICS: | 621.381 SOU DIGITAL ELECTRONICS: | 621.381 SOU DIGITAL ELECTRONICS: | 621.381 STR RELIABILITY WEAROUT MECHANISMS IN ADVANCED CMOS TECHNOLOGIES | 621.381 STR SOLID STATE ELECTRONIC DEVICES | 621.381 SUP INTRODUCTION TO SPINTRONICS | 621.381 SUP LESSONS FROM NANOELECTRONICS : VOLUME 1 |
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