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ELECTRONIC DESIGN AUTOMATION:
Material type:
TextPublication details: MORGAN KAUFMANN; 2009Description: 934 PISBN: - 9780123743640
- 621.395 WAN
| Item type | Current library | Call number | Status | Notes | Date due | Barcode | |
|---|---|---|---|---|---|---|---|
| Reference | VIT Central Library | 621.395 WAN (Browse shelf(Opens below)) | Not for loan | ELECTRONICS | 30060 |
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| 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES | 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES | 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES | 621.395 WAN ELECTRONIC DESIGN AUTOMATION: | 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES: DESIGN FOR | 621.395 WAN SUB THRESHOLD DESIGN FOR ULTRA LOW POWER SYSTEMS | 621.395 WES CMOS VLSI DESIGN |
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