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VLSI TEST PRINCIPLES AND ARCHITECTURES: DESIGN FOR
Material type:
TextPublication details: MORGAN KAUFMANN PUBLISHERS; 2011Description: 777 PISBN: - 9789380501550
- 621.395 WAN
| Item type | Current library | Call number | Status | Notes | Date due | Barcode | |
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VIT Central Library | 621.395 WAN (Browse shelf(Opens below)) | Available | ELECTRONICS | 31207 |
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| 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES | 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES | 621.395 WAN ELECTRONIC DESIGN AUTOMATION: | 621.395 WAN VLSI TEST PRINCIPLES AND ARCHITECTURES: DESIGN FOR | 621.395 WAN SUB THRESHOLD DESIGN FOR ULTRA LOW POWER SYSTEMS | 621.395 WES CMOS VLSI DESIGN | 621.395 WES CMOS VLSI DESIGN |
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