000 00407nam a2200169Ia 4500
008 181012s9999 xx 000 0 und d
020 _a9781441993762
082 _a621.38152 BHU
100 _aBHUSHAN MANJUL
245 0 _aMICROELECTRONIC TEST STRUCTURES FOR CMOS TECHNOLOGY
260 _bSPRINGER
260 _c2011
300 _a373 P
365 _b9902.19
650 _aELECTRONICS
942 _cREF
999 _c17813
_d17812