000 00529nam a2200205Ia 4500
008 201226s9999 xx 000 0 und d
020 _a9781498738200
082 _a620.110727 CRC
100 _aSIMMONS JEFFREY P
245 0 _aSTATISTICAL METHODS FOR SCEINCE THE DATA SCEINCE OF MICROSTRUCTURES CHARACTERIZATION
250 _a1 ST
260 _bCRC PRESS
260 _c2019
300 _a514 P
365 _b17765
650 _aMECHANICAL
700 _aBOUMAN CHARLES
700 _aDRUMMY LAWRENCE F
942 _cREF
999 _c73870
_d73870